Equipment Applications


Application

Different Applications of Wafer AOI Products



01

Processor Chip

Characteristics:

1.Complex graphical background.
2.Requirement for  3D measurement of bumps.
3.High defect rejection criteria.


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02

Communication Chip

Characteristics:

1. High detection accuracy in optical port areas.
2. Requirement for measurement of  optical port width.


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03

Memory

Characteristics:

1.High number of pads.
2.High pattern  repetitiveness.
3. General defect  rejection criteria.


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04

Sensor Chip

Characteristics:

1.High detection accuracy on light-receiving surfaces.
2.Small die size.
3.General defect  rejection criteria.


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05

Power Management

Characteristics:

1.Noisy background.
2.Many needle marks.
3.General defect rejection criteria


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Applications of Wire Bonding AOI Products in Different Packaging Types



Gold Wire Inspection

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3D Gold Wire Inspection

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TO Series

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Photosensitive Chip

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LED Chip

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Applications of Leader Scan Products in Different Packaging Types



 

QFP-Lead Collapse (2D)

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QFP-Lead 3D Measuremen

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QFN-Foreign Material

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Pre-Seal Inspection -      Reel Product
Reversed

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BGA- Solder Ball (Pad)  Foreign Material
Contamination

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