
Classification:
Strip inspection machine
Application: Applied to post-plastic sealing or post-plating, post-modeling and other processes, it can detect defects in plastic seals, pins and substrates on the front and back surfaces of chips, achieve energy saving and efficiency improvement, and improve yield.
· Automatic leveling of deformed products and adjustment of tracks.
· Supports front and back side inspection.
· Ink dot marking and laser NG marking.
Advantages
- High Compatibility: Automatically compensates for product deformation and adjusts track width, minimizing manual adjustments.
- Quality Control: Flexible combination of multiple NG (No Good) identification modes, with simultaneous physical (ink dotting & laser) and software (mapping) NG annotation, enhancing process quality control and reducing batch defects.
- Equipment Performance: Minimum detectable feature size ≥ 25 micrometers (μm), utilizing a self-developed combined light source and sophisticated AI algorithms in the optical system, compatible with and adaptable to various products for different inspection needs.
- Product Description
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- Commodity name: Strip inspection machine
- Commodity ID: A-000-1
- 应用: <strong>Application:</strong> Applied to post-plastic sealing or post-plating, post-modeling and other processes, it can detect defects in plastic seals, pins and substrates on the front and back surfaces of chips, achieve energy saving and efficiency improvement, and improve yield.
· Automatic leveling of deformed products and adjustment of tracks.<br> · Supports front and back side inspection.<br> · Ink dot marking and laser NG marking.
Advantages
- High Compatibility: Automatically compensates for product deformation and adjusts track width, minimizing manual adjustments.
- Quality Control: Flexible combination of multiple NG (No Good) identification modes, with simultaneous physical (ink dotting & laser) and software (mapping) NG annotation, enhancing process quality control and reducing batch defects.
- Equipment Performance: Minimum detectable feature size ≥ 25 micrometers (μm), utilizing a self-developed combined light source and sophisticated AI algorithms in the optical system, compatible with and adaptable to various products for different inspection needs.
Keywords :
AOI Equipment
Automation
Software Systems
AOI Vision Upgrade
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